Theoretical frequency limit of organic field-effect transistors
نویسندگان
چکیده
منابع مشابه
Organic Field-Effect Transistors
Organic field-effect transistors (OFETs) were first described in 1987. Their characteristics have undergone spectacular improvements during the last two or three years. At the same time, several models have been developed to rationalize their operating mode. In this review, we examine the performance of OFETs as revealed by recently published data, mainly in terms of field-effect mobility and o...
متن کاملOrganic field effect transistors
This chapter aims to provide the reader with a practical knowledge about electrical methods to measure organic thin film transistor devices. It presents a series of recipes, which allow the experimentalist to gain insight into the performance and limitations of the devices and circuits being measured. It also gives guidelines on how to correctly interpret the measurements and to provide feedbac...
متن کاملOrganic Field-Effect Transistors
Over the past twenty years, research into the applications of organic semiconductors (OSCs) has intensified rapidly. Though their electron mobility is much lower than that of typical semiconductors, OSCs show promise in low-cost, flexible, lightweight, and environmentally-friendly semiconductor applications. Their hole mobility was found to be comparable to that of amorphous silicon (a-Si), wit...
متن کاملOrganic semiconductors for organic field-effect transistors.
The advantages of organic field-effect transistors (OFETs), such as low cost, flexibility and large-area fabrication, have recently attracted much attention due to their electronic applications. Practical transistors require high mobility, large on/off ratio, low threshold voltage and high stability. Development of new organic semiconductors is key to achieving these parameters. Recently, organ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Flexible and Printed Electronics
سال: 2019
ISSN: 2058-8585
DOI: 10.1088/2058-8585/ab59cc